SURFACE AND MATERİAL ADVANCED RESEARCH AND TECHNOLOGY LAB Dicle university SURFACE AND MATERİAL ADVANCED RESEARCH AND TECHNOLOGY LAB

PERSONEL Uzmanlar Yüksek Lisans Öğrencileri: Doktora Öğrencileri: Dr. M. Fatih GENİŞEL , Dr. Yusuf Selim OCAK Dr. Ömer ÇELİK, Dr. Kemal AKKILIÇ, Dr. Tahsin KILIÇOĞLU Yüksek Lisans Öğrencileri: Seniha ADIGÜZEL, Erdal……, Recep KOYUNCU Doktora Öğrencileri: Ahmet TOMBAK, Derya KAYA, Murat TOKUŞ, Fırat ANĞAY, Canan AYTUĞ AVA, Çiğdem AKMANSOY Uluslararası Ziyaretçiler: Mostefa ben Haliliba - Algeria Mohammed Salah Aida - Algeria, Maryam RANJBAR - Iran

DEVAM EDEN PROJELER “Ultrasonik Sprey Kaplama Tekniği ile Bazı Metal Oksit Yarıiletken İnce Filmlerin Oluşturulması ve Güneş Pili Üretiminde Kullanılması” Dicle Üniversitesi BAP, Proje No:13ZEF29, 2013-…. “Growth of Cu2ZnTiS4 and Cu2ZnTi(S,Se)4 thin films by reactive co-sputtering technique and their usage in the fabrication of solar cells” No: 114F363 , TUBİTAK, 2015-….. “Fabrication of quaternary semiconductor thin film for solar cell applications by ultrasonic spray method” No: 115F234 , TUBİTAK, 2015-…… “Residual Stress and Texture analysis of metal nitride thin films”, Dicle Üniversitesi Bilimsel Araştırmalar Koordinatörlüğü, DÜBAB, Proje No: ZGEF.15.009, 2015-……,

ÇALIŞMA ALANLARI Fotovoltaik İnce Filmler Ve Güneş Pili -Thin Film Photovoltaics, Solar Cells DSSC’ler (Dye-sensitized Solar Cells ) Korozyon Dirençli Sert Kaplamalar - Corrosion Resistive Hard Coatings Atomik İnce Pasivasyon Tabakaları Atomically Thin Passivation Layers Hidrotermal Nanoparçacık Sentezi- Hydrothermal Nanoparticle Synthesis Ultrasonik Metal Oksitler Oluşturma -Ultrasonically Grown Metal Oxides Meteryallerin Optiksek Ve Elektriksel Karekterisazyonu- Optical And Electrical Characterization Of Materials

ÇALIŞMA ALANLARI-devam Metal/Yarıiletken Kontaklar- Metal/Semiconductor Contacts, Metal/Yalıtkan(Oksit)/Yarıiletken (MOS) – Metal/Oxide/Semiconductor İnce Filmlerin Sıcaklığa Bağlı Faz Değişimleri, İnce Filmlerin Stress Ve Texture Analizleri

ATOMIC LAYER DEPOSITION(ALD)

ATOMİC LAYER DEPOSITION (ALD) Perfect atomic monolayer films Very controllable atomic thickness Pure metals can be grown (Pt, Ag, Cu, W, etc.) Dielectric layers, insulating layers, etc., Solar Cell surface passivations Conductive pathways, catalytic surfaces, MOS devices

PHYSICAL VAPOR DEPOSITION SYSTEM

THERMAL EVAPORATION SYSTEM Reafractory metals can be coated Some available targets in our lab; Mo, MoS2, WC, Si3N4, TiB2, BN Nb, ITO, AZO, SiO2, In, Cu, Al, Fe, Ag, Sn, W, V, Yttrium, Zr, Ni, CdS, Some alloys and Nitrides Thermal evaporation of metals

Nanovak NVTS-400 Vacum System RF AND DC SPUTTER SYSTEM Nanovak NVTS-400 Vacum System Nitrogen, Argon ve Oxigen

SPIN COATING SYSTEM 28 step controller up to 10000 rpm spin speed Metal oxides (ZnO, CuO, CdO, Y2O3, NiO, ITO, etc.) Solar Cell Absorber Layers (Copper zinc tin sulfide - CZTS, Cu2CoSnS4 - CCTS, etc.) Polymer Coating

ULTRASONIC SPRAY PYROLYSİS Almost all metal oxides cen be coated Main advantage: Large area production Minimum solution consume Thin films without oxygen can be grown by continous nitrogen flow Solar cell absorber layers , metal nanoparticles can be coated to substrates

NITROGEN GENERATOR 33 lt/min N2 production capacity 99.99% grade N2 gas for all lab process

ANNAEALING FURNACES Annealing process done up to 1050°C Quartz tube diameter is 70mm

CHEMICAL VAPOR DEPOSITION SYSTEM Carbon Nanotube produced with this system 3 MKS mass flow controller Could be heated up to 1450 °C Easy sample mounting with homemade loadlock system Suitable for CVD production

CHARACTERIZATION DEVICES MATERIAL TESTING AND CHARACTERIZATION DEVICES

CHARACTERIZATION DEVICES MATERIAL TESTING AND CHARACTERIZATION DEVICES Keithley 2400 Sourcemeter Agilent HP 4294A Impedance Analyser Ecopia HMS 300 Hall Effect Measurement

CHARACTERIZATION DEVICES MATERIAL TESTING AND CHARACTERIZATION DEVICES Lucas Lab Pro-4 Resistance of surface measurement system by 4 point for thin films

CHARACTERIZATION DEVICES MATERIAL TESTING AND CHARACTERIZATION DEVICES Spectroscopic Ellipsometer Janis Cryostat Fused quartz windows 4-way optical access (f = 1.0) Si diode thermometer and heater (thermocouple for VPF-800) Electrical feedthrough for thermometry Optical sample holder Refill assembly for continuous operation

CHARACTERIZATION DEVICES MATERIAL TESTING AND CHARACTERIZATION DEVICES Solar Simulator Solar cell testing Illumination response of diodes